Date: March 1-2, 2010

Location: PLI New York Center; New York, NY

Session Title: “Inter Partes Reexamination – Earning Its Way in the Litigator’s Toolbox”

Speakers:
David L. McCombs, Haynes and Boone, LLP
Scott A. McKeown, Oblon, Spivak, McClelland, Maier & Neustadt, P.C.

Session Description:
This panel discussion will focus on the following elements of inter partes patent reexamination: trends and success rates, cutting-edge strategies, interplay with litigation, and potential effect of pending legislation.

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